The International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, security and diagnosis of electronic digital and analog circuits and systems. The 28th edition of the DDECS Symposium will be held in Lyon, a vibrant city located in east-central France, known for its rich history, stunning architecture, gastronomy, and vibrant cultural scene. You are invited to participate and submit your contributions to DDECS’25. The areas of interest include (but are not limited to) the following topics: - Design and Test of the Next Generation Chips - Emerging Technologies Design, Test and Diagnosis - Analog Circuit Design and Diagnosis - Security Challenges in Quantum and post-Quantum Era Submissions DDECS‘25 seeks original, unpublished contributions of the following types: • Regular Papers (6 pages) presenting novel and complete research work • Student Papers (4 pages) from students eager to discuss their on-going research Additional information: DDECS’25 will produce Formal Proceedings of accepted papers with ISBN number that will be included in the IEEE Xplore Digital Library. An Informal digest will be produced to include additional conference contents.